Instruments & Software

Market leading, high performance X-ray photoelectron spectrometer. Made to measure for the most demanding materials characterisation applications.

The ESCApe data system encompasses instrument control, data acquisition and data processing in a single, easy to use package. With a user-friendly interface and advanced features, our software streamlines the analytical process, saving you time and maximising efficiency. It’s the latest generation of software for use with AXIS Supra+ and AXIS Nova photoelectron spectrometers.

This multi-mode gas cluster ion source is designed to operate in both Arn+ cluster and Ar+ monatomic modes making it suitable for sputter cleaning and depth profiling organic, inorganic and metallic thin films. In addition it may also be used to generate low energy He+ ions for use with ion scattering spectroscopy (ISS).

The Minibeam 4 is designed to produce a stable, high current, monatomic Ar+ ion beam with energies from 0.5 to 4 keV. It is ideally suited to sputter cleaning and depth profiling inorganic and metallic films. It may also be used to generate low energy He+ ions for use with ion scattering spectroscopy (ISS).

The VCIS designed to produce a stable, high current, monatomic Ar+ ion beam and Ar cluster ions. It is ideally suited to sputter cleaning and depth profiling all types of materials. VCIS may also be used to generate low energy He+ ions for use with ion scattering spectroscopy (ISS).