AXIS Supra+ : XPS Surface Analysis Instrument
Market leading, high performance X-ray photoelectron spectrometer. Made to measure for the most demanding materials characterisation applications.
ESCApe data system
The ESCApe data system encompasses instrument control, data acquisition and data processing in a single, easy to use package. With a user-friendly interface and advanced features, our software streamlines the analytical process, saving you time and maximising efficiency. It’s the latest generation of software for use with AXIS Supra+ and AXIS Nova photoelectron spectrometers.
Minibeam 6: Gas Cluster Ion Source (GCIS)
This multi-mode gas cluster ion source is designed to operate in both Arn+ cluster and Ar+ monatomic modes making it suitable for sputter cleaning and depth profiling organic, inorganic and metallic thin films. In addition it may also be used to generate low energy He+ ions for use with ion scattering spectroscopy (ISS).
