Established first-generation Incident Photon-to-electron Conversion Efficiency (IPCE) measurement system at Academia Sinica
Official establishment of Enlitech Co., Ltd.
- Successfully developed second-generation QE-R (Quantum Efficiency-Reference) measurement system
- QE systems adopted by leading research institutions and PV manufacturers in Taiwan
- October: Investment proposal approved by the 101st National Science Council Review Committee
- Established manufacturing facility in Kaohsiung Science Park, becoming a key supplier of advanced optoelectronic testing equipment
Initiated R&D in CCD/CMOS image sensor characterization technology, developing non-destructive optical inspection systems
- Ā Advanced optical modulation technology for image sensor analysis, enabling reverse characterization of analog parameters including quantum efficiency, system gain, Photo
- Response Non-Uniformity (PRNU), and dark current characteristicsRelocated to Southern Taiwan Science Park (STSP), focusing on advanced optical metrology equipment development
- Hosted successful Photovoltaic Process and Characterization Technology Workshop
- Launched QE-III (Enhanced Incident Photon-to-electron Conversion Efficiency system), achieving market leadership in Taiwan
- Expanded market presence to Europe and China
- Secured approval for advanced R&D initiatives at STSP, validating technological capabilities
Achieved IEC recommended supplier status
- Successfully developed integrated QE-156 & Photoluminescence (PL) measurement system
- Secured continued approval for advanced R&D projects at STSP
- Organized Concentrated Photovoltaic (CPV) Technology Symposium
Established MOU for Reference Cell Manufacturing and Calibration Technology Research, initiating measurement traceability standards
- Enlitech's Solar Cell Spectral Response/Quantum Efficiency measurement systems received ISO/IEC 17025 (TAF) laboratory certification
- QE measurement system received validation from National Institute of Advanced Industrial Science and Technology (AIST)
- QE system adopted by National Institute of Metrology (NIM)
Developed aerospace-grade image sensor characterization system SG-U
- Multiple system acquisitions by national aerospace agencies for advanced scientific image sensors and satellite optical camera characterization
- Quantum Efficiency measurement system adopted by Indian Institute of Technology
- Quantum Efficiency measurement system implemented by Professor Christoph Brabec's research group at Friedrich-Alexander-UniversitƤt Erlangen-NĆ¼rnberg
- Large-area solar cell spectral response measurement system adopted by Solar Energy Research Institute of Singapore (SERIS)
- Established new sales and service operations in Shanghai
Successfully developed SR-M21 solar module quantum efficiency measurement system
Spectral Response/Quantum Efficiency measurement systems implemented by prestigious institutions including Duke University, University of Toronto, Hong Kong University of Science and Technology, and Hyundai Heavy Industries
Commercialized aerospace-grade characterization technology for industrial applications, introducing SG-A system for CMOS image sensor and CIS camera module qualification
- Established new sales and service center in Hsinchu Science Park
- Received renewed ISO/IEC 17025 (TAF) laboratory certification for Solar Cell Spectral Response/Quantum Efficiency measurements
Institute of Chemistry, Chinese Academy of Sciences (ICCAS) implemented Enlitech's AAA Solar Simulator (SS-F5-3A) and Spectral Response/Quantum Efficiency system (QE-R), achieving record efficiency in non-fullerene polymer solar cells
- Expanded into Nordic market with AAA Solar Simulator (SS-F5-3A) and QE-R systems adopted by Linkƶping University, Sweden
- Image Sensor Characterization System (MV-IS) implemented by China Quality Certification Centre, Superpix Technology Co Ltd, and leading IC design houses
- Jolywood adopted comprehensive Spectral Response/Quantum Efficiency measurement system (S6)
- AAA Solar Simulator and QE-R systems adopted by major research institutions including CAS, SCUT, IIT, TIFR, NEHU, IISERTVM, and SSN
- UV LED characterization system (LQE-10-UVVISIR) implemented by INER
- BSMI Taiwan adopted laser and UV safety certification system (LSC-60825; IEC 60825-1:2014 compliant)
Canadian Solar implemented full-area Spectral Response/Quantum Efficiency measurement system (S6)
- Indian Space Research Organisation (ISRO) adopted advanced Image Sensor Characterization System (RCSIS-3018) for aerospace CMOS development
- Strategic collaboration with CMOS Sensor Inc. for satellite imaging chip development
- Developed advanced FLIM (Fluorescence Lifetime Imaging Microscope) system (SLI-PE-M200; 200mm x 200mm) utilizing TCSPC mapping technology
- Expanded market presence in India, Germany, and Singapore with AAA Solar Simulator and QE-R systems
- JA Solar implemented full-area Spectral Response/Quantum Efficiency measurement system (S6)
- Advanced UV LED measurement system (UV LED-263-781-008) adopted by Taiwan BSMI
Introduced optical under-display fingerprint characterization solutions
Successfully developed integrated LED quantum yield and photoluminescence efficiency measurement system
Successfully developed and delivered wafer-level photoelectric characterization system for aerospace applications
Launched advanced solar cell characterization system focusing on Voc loss analysis, adopted by world-leading research facilities
Introduced SG-O wafer-level image sensor characterization platform, integrating automated probe station technology with precision spectral analysis for CIS design verification and process control
- Advanced solar cell characterization equipment adopted by major European and American manufacturers
- Image sensor characterization systems adopted by automotive and consumer electronics manufacturers
- Successfully developed specialized starlight simulation system for aerospace applications
- Received recognition for COVID-19 pandemic relief contributions
Developed SPD2200 single-photon detector characterization solution for SPAD and SiPM devices, enabling full-spectrum response and Photon Detection Probability (PDP) measurements for dToF LiDAR applications
- Launched refreshed corporate identity
- Completed state-of-the-art clean room facility
- Successfully completed R&D projects for 5G imaging sensor characterization and perovskite solar cell Voc loss analysis
- May: Joined Taiwan Electronic Equipment Industry Association
- November: Became member of European Machine Vision Association (EMVA)
November: Established second office in Kaohsiung Asia New Bay Area Innovation Park
November 29: Completed Initial Public Offering
- October: Qualified as supplier to one of world's top three semiconductor foundries
- August: Established third facility in Nanzih District, Kaohsiung Science Park
- April: Supported TSMC Charity Foundationās āSpreading Loveā initiative by donating a rooftop solar power system to the Chi-Chih Academy, a social welfare institution, and received a certificate of appreciation.
- May: Became major supplier of semiconductor metrology equipment in US market; participated in International Image Sensor Workshop (IISW) 2023 in Edinburgh
- January: SPD2200 single-photon detector characterization system integrated into supply chain of leading SPAD wafer foundry
March 18: Successfully listed on Taipei Exchange Emerging Stock Board
November: Joined SEMI Silicon Photonics Industry Alliance (SiPhIA)
March 6: Listed on the OTC market, stock code 7728
June: Joined International Heterogeneously Integrated Silicon Photonics Alliance (HiSPA)
February 26: Quality Management System Certified in 2026 under ISO 9001:2015
