ENLITECH

Enlighten Your Ideas!

Founded in 2009, Enlitech empowers customers with superior solutions in artificial light sources and spectral analysis through innovation and a commitment to excellence.

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Facing the global AI boom and high-speed optical demand, Night Jar is a next-generation SiPh solution. It provides accurate, efficient wafer-level optical loss testing (WAT, CP, FT). The system integrates mainstream probers to accelerate design verification, shorten cycles, and ensure quality for PIC/EIC SOIC mass production.

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