WSxM is a Windows-based application for scanning probe microscopy (SPM) data acquisition, visualization, and analysis. It supports common SPM techniques such as AFM, STM, and MFM, and reads a wide range of instrument file formats. Key features include image leveling and line-by-line flattening, plane and drift correction, filtering and FFT, cross-section profiling, roughness and grain/particle statistics, 3D rendering, customizable color scales and annotations, and movie/figure export. When paired with compatible controllers, it can handle real-time instrument control; off-line, it serves as a powerful environment for processing and presenting nanoscience data. Widely used in research and education, WSxM helps convert raw SPM scans into publication-quality results.
WSxM is developed by Nanotec Electrónica and is used by 4 users of Software Informer. The most popular versions of this product among our users are: 1.0 and 3.0. The name of the program executable file is WSxM.exe. Works with mpp, zv, ch3, ch4, sti, stm, dst, stp, cim, cit, top, adh, ch16, ch10 and ch15 file types.
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