SIMION, developed by Scientific Instrument Services, Inc., is a specialized simulation environment for designing and analyzing charged-particle and ion optics. It models and visualizes ion and electron trajectories in user-defined electrostatic and magnetic fields, helping engineers and scientists optimize instruments such as mass spectrometers, ion traps, beamlines, and electrostatic lenses.
Key capabilities:
- 2D/3D field modeling: Solves for potentials on discrete grids (potential arrays) and computes particle trajectories through the resulting fields.
- Fast workflow: Refine fields once and quickly adjust electrode voltages without a full re-solve to explore design variations.
- Flexible geometry: Build electrode structures with the integrated tools; utilities are available to import from common CAD workflows.
- Scripting and extensibility: Use Lua scripting to automate studies, run parameter sweeps, define custom field or force models, and implement gas-collision or reaction logic.
- Magnetic and time-varying fields: Combine electrostatic and magnetic fields, including user-defined or data-driven B-fields and time-dependent voltages.
- Visualization and analysis: Inspect fields and trajectories in 3D, extract time-of-flight and energy data, and export results for further analysis.
- Platform: Commercial Windows application commonly used in research, development, and education.
SIMION is widely adopted in analytical chemistry, physics, and engineering for rapid prototyping, optimization, and insight into charged-particle behavior before committing to hardware.
SIMION is developed by Scientific Instrument Services, Inc.. The most popular version of this product among our users is 8.0. The names of program executable files are simion-nosse2.exe, simion.exe.
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