Beating The Heat In 3D Packages


Key Takeaways: Thermal management is a central design constraint, requiring early, thorough planning. Accurate thermal simulation requires AI-driven adaptive meshing and real-world validation. Innovative STCO strategies can drastically reduce GPU peak temperature. As HPC and AI accelerators push power densities to 1kW and beyond, the heat generated by rapidly switching tran... » read more

Making Hybrid Bonding Better


Key Takeaways Fab processes are optimizing for cleanliness, planarity, and high bond quality. Nanotwinned copper and SiCN PVD enable lower anneal and deposition temperatures for HBM. A thin, protective layer helps preserve the Cu/dielectric during aggressive processes. The future of semiconductor manufacturing is no longer dependent just on shrinking features. Instead, chipm... » read more

One-on-One With proteanTecs CEO Shai Cohen


The acceleration of technology is unprecedented: AI data centers, edge build-out, robotics, photonics, quantum, multi-die assemblies. Semiconductor Engineering Editor in Chief Ed Sperling talks with proteanTecs CEO Shai Cohen about what's changing and what impact it will have. Click here to listen. » read more

Chiplets And 3D-ICs Add New Electrical And Mechanical Challenges


Key Takeaways • Chiplets and 3D-IC architectures add new thermal-mechanical stresses that can affect the reliability of entire systems. • As chiplets are assembled into packages, defectivity targets become more stringent for each component in a system. • Traditional silos are breaking down, forcing design teams to address issues such as materials choices that previously were handled by... » read more

Resistance In Advanced Packages Is Now A System-Level Problem


Key Takeaways Kelvin measurement, which has been in use for decades, is no longer sufficient for addressing resistance in complex chips. The problem is that resistance is no longer concentrated in transistors, and where it does show up isn't always consistent or obvious. Traditional pass/fail approaches need to be replaced by more granular and flexible analytics and methodologies. ... » read more

Why Move To 2nm?


Key Takeaways: Scaling digital logic still provides significant benefits, especially lower power. Multi-die assemblies will be the predominant approach, and most of the circuitry will not be 2nm or below. While these systems are inherently more flexible, the number and complexity of tradeoffs required for optimizing PPA/C are increasing. The rollout of 2nm process nodes and ... » read more

Multi-Die Assemblies Require More Detailed Test Plan Earlier


Key Takeaways Design for test takes on new urgency in complex multi-die assemblies, where it can be used to minimize downstream errors and the cost of fixing them. DFT needs to be increasingly detailed due to more connections and the inability to access some components. DFT strategies need to be developed earlier and may require multiple testing approaches. Multi-die assembl... » read more

Challenges In Moving Data In Chips


The number of processes running simultaneously inside of chips is growing, fueled by massive increases in data from AI and sensors everywhere. The challenge now, particularly in multi-die assemblies, is how to prioritize where signals go, how quickly they move, and when they're supposed to arrive at shared memories. Andy Nightingale, vice president of product management and marketing at Arteris... » read more

Wafer Probe Struggles To Adapt To Multi-Die Assemblies


Wafer probe, one of the key processes for ensuring reliability in semiconductor manufacturing, is becoming increasingly unreliable in multi-die assemblies and at leading-edge nodes. For much of the semiconductor industry’s history, wafer probe occupied a stable, largely uncontested role in manufacturing. It was understood as a screening step, an electrical checkpoint to identify failing de... » read more

Secure Data Sharing Becoming Critical For Chip Manufacturing


Semiconductor companies increasingly need to share data to solve problems faster, boost yield, and trace the root cause of failed devices. But to make that work, companies need assurances that their data will be secure, free from data leaks that could result in the loss of valuable IP. Data sharing is becoming critical at leading device nodes, where process variability is starting to consume... » read more

← Older posts