PANalytical X'Pert Texture 1.2

PANalytical X'Pert Texture is a specialized software package from PANalytical B.V. designed for crystallographic texture analysis using X-ray diffraction (XRD) data. It streamlines the entire workflow—from measurement setup and data acquisition on X’Pert diffractometers to processing, visualization, and quantitative interpretation—so you can accurately characterize preferred orientation in metals, ceramics, thin films, and geological materials.

Key capabilities include:

• Integrated texture measurements on X’Pert systems with guided, reproducible workflows.
• Calculation and visualization of pole figures and inverse pole figures, with clear, publication-quality plots.
• Orientation Distribution Function (ODF) analysis to quantify texture, including common metrics such as multiples of random distribution (m.r.d.), texture index, and volume fractions of orientation components.
• Robust data corrections (e.g., background, absorption, and instrument-related effects) and support for crystal and sample symmetry.
• Flexible reporting and export of figures, tables, and data for downstream analysis or archiving.

By combining intuitive tools with proven algorithms, X'Pert Texture helps materials scientists and engineers link processing conditions to microstructural anisotropy and performance. Whether you are evaluating rolling textures in sheet metals, aligning phases in ceramics, or assessing thin-film orientation, the software provides reliable, repeatable results with clear visualization and reporting.

PANalytical X'Pert Texture is developed by PANalytical B.V.. The most popular versions of this product among our users are: 1.1, 1.1 beta and 1.2. The name of the program executable file is WinTex.exe.