Add unit tests for sSerialStopBitsToStr#14
Add unit tests for sSerialStopBitsToStr#14zknpr wants to merge 1 commit intosecurity-fixes-and-community-prsfrom
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Added unit tests to verify the behavior of `sSerialStopBitsToStr` function, covering all enum values and invalid input. Enabled testing in CMakeLists.txt and added a `tests` directory. Co-authored-by: zknpr <96851588+zknpr@users.noreply.github.com>
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Summary of ChangesHello @zknpr, I'm Gemini Code Assist1! I'm currently reviewing this pull request and will post my feedback shortly. In the meantime, here's a summary to help you and other reviewers quickly get up to speed! This pull request focuses on enhancing code quality and reliability by introducing a dedicated unit test suite for the Highlights
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Code Review
This pull request adds unit tests for the sSerialStopBitsToStr function, which is a great addition for ensuring code quality. The changes to the CMake files correctly set up the testing infrastructure. The test cases in tests/test_serial.c cover the main scenarios, including valid and invalid inputs. I've suggested a refactoring of the test function to use a data-driven approach. This will reduce code duplication and make the tests more maintainable and easier to extend in the future.
| void test_sSerialStopBitsToStr() { | ||
| printf("Testing sSerialStopBitsToStr...\n"); | ||
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| // Test SERIAL_STOPBIT_ONE -> "1" | ||
| const char * result1 = sSerialStopBitsToStr(SERIAL_STOPBIT_ONE); | ||
| assert(result1 != NULL); | ||
| assert(strcmp(result1, "1") == 0); | ||
| printf("SERIAL_STOPBIT_ONE -> %s [PASS]\n", result1); | ||
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| // Test SERIAL_STOPBIT_TWO -> "2" | ||
| const char * result2 = sSerialStopBitsToStr(SERIAL_STOPBIT_TWO); | ||
| assert(result2 != NULL); | ||
| assert(strcmp(result2, "2") == 0); | ||
| printf("SERIAL_STOPBIT_TWO -> %s [PASS]\n", result2); | ||
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| // Test SERIAL_STOPBIT_ONEHALF -> "1.5" | ||
| const char * result3 = sSerialStopBitsToStr(SERIAL_STOPBIT_ONEHALF); | ||
| assert(result3 != NULL); | ||
| assert(strcmp(result3, "1.5") == 0); | ||
| printf("SERIAL_STOPBIT_ONEHALF -> %s [PASS]\n", result3); | ||
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| // Test SERIAL_STOPBIT_UNKNOWN -> "Unknown" | ||
| const char * result4 = sSerialStopBitsToStr(SERIAL_STOPBIT_UNKNOWN); | ||
| assert(result4 != NULL); | ||
| assert(strcmp(result4, "Unknown") == 0); | ||
| printf("SERIAL_STOPBIT_UNKNOWN -> %s [PASS]\n", result4); | ||
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| // Test Invalid Value -> "Unknown" | ||
| const char * result5 = sSerialStopBitsToStr((eSerialStopBits)999); | ||
| assert(result5 != NULL); | ||
| assert(strcmp(result5, "Unknown") == 0); | ||
| printf("Invalid (999) -> %s [PASS]\n", result5); | ||
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| printf("All sSerialStopBitsToStr tests passed.\n"); | ||
| } |
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The test function test_sSerialStopBitsToStr contains repetitive code for each test case. This can be improved by adopting a data-driven approach. By defining test cases in an array of structs and iterating through them, you can significantly reduce code duplication. This makes the test function cleaner, easier to read, and simpler to extend with new test cases in the future.
void test_sSerialStopBitsToStr() {
printf("Testing sSerialStopBitsToStr...\n");
struct test_case {
const char* name;
eSerialStopBits input;
const char* expected;
};
struct test_case cases[] = {
{"SERIAL_STOPBIT_ONE", SERIAL_STOPBIT_ONE, "1"},
{"SERIAL_STOPBIT_TWO", SERIAL_STOPBIT_TWO, "2"},
{"SERIAL_STOPBIT_ONEHALF", SERIAL_STOPBIT_ONEHALF, "1.5"},
{"SERIAL_STOPBIT_UNKNOWN", SERIAL_STOPBIT_UNKNOWN, "Unknown"},
{"Invalid (999)", (eSerialStopBits)999, "Unknown"},
};
int num_cases = sizeof(cases) / sizeof(cases[0]);
for (int i = 0; i < num_cases; ++i) {
const char* result = sSerialStopBitsToStr(cases[i].input);
assert(result != NULL);
assert(strcmp(result, cases[i].expected) == 0);
printf("%s -> %s [PASS]\n", cases[i].name, result);
}
printf("All sSerialStopBitsToStr tests passed.\n");
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Tests merged into v1.5.3 as combined test suite. Thank you Jules! |
You're welcome! I'm glad the tests were useful and successfully merged. |
Add comprehensive test suite for serial port configuration functions: - sSerialFlowToStr: flow control type conversion - sSerialDataBitsToStr: data bits conversion - sSerialStopBitsToStr: stop bits conversion - sSerialParityToStr: parity conversion Test infrastructure: - tests/test_serial.c: All serial function tests - tests/CMakeLists.txt: CTest integration - BUILD_TESTING option in main CMakeLists.txt Based on Jules AI contributions from PRs #10, #11, #14, #15 Reviewed by: Gemini Code Assist Co-Authored-By: google-labs-jules[bot] <161369871+google-labs-jules[bot]@users.noreply.github.com>
This PR adds unit tests for
sSerialStopBitsToStrinsrc/serial.c.tests/test_serial.cwith test cases for valid and invalid inputs.tests/CMakeLists.txtto define the test executable.CMakeLists.txtto enable testing and include thetestssubdirectory.ctest.PR created automatically by Jules for task 7718948011588042311 started by @zknpr