Revert "[SYCL] XFAIL LIT test due to duplicate diagnostic"#1460
Revert "[SYCL] XFAIL LIT test due to duplicate diagnostic"#1460bader merged 1 commit intointel:syclfrom
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This reverts commit a28778c and fixes the test. Signed-off-by: Premanand M Rao <premanand.m.rao@intel.com>
Signed-off-by: Vladimir Lazarev <vladimir.lazarev@intel.com>
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Do you know what is the reason for duplicated diagnostics?
Why it didn't reproduce before new deferred diagnostics?
Basically what they are trying to solve with: https://reviews.llvm.org/D77028
We had a densemap of each caller-callee which had its diagnostic deferred. That prevented the second visit (at least in this case). We had other issues with duplicate messages that you had worked on. |
@premanandrao, the test is already marked as expected to fail, so could we wait until the fix lands into the llvm-project and pull it into sycl branch, rather than update the test with wrong checks? |
We could if that is what you prefer. You had asked @vladimirlaz to revert marking the test as "XFAIL", which is what I trying to help with. |
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Sorry for confusion. I draw Vladimir's attention that his approach to fix the test is a temporal workaround, which we should revert asap and replace with proper solution. |
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it looks like https://reviews.llvm.org/D77028 was submitted but it doe not resolve the case. |
…_docs * origin/sycl: (6482 commits) [SYCL][NFC] Clean formatting in Markdown documents (intel#1635) [SYCL][Doc] Remove obsolete parens from README (intel#1637) [SYCL] Fix failing ABI tests when LLVM_LIBDIR_SUFFIX is set (intel#1605) [SYCL] Fix warnings in libdevice (intel#1630) [SYCL][CUDA] Triage and clean LIT (intel#1620) [SYCL][NFC] Fix GCC 8 compilation warnings (intel#1631) [SYCL] Minor fixes in LowerWGScope [SYCL] PI: correct default interoperability plugin selection [SYCL] Add faster reduction implementations using atomic or/and intel::reduce() (intel#1615) [SYCL] Add sycl-ls utility for listing devices discovered/selected by SYCL RT (intel#1575) [SYCL] Fix getDeviceFromHandler declarations (intel#1626) [SPIR-V] Correct/improve declaration of SPIR-V builtins (intel#1519) [SYCL][USM] Improve USM allocator test and fix improper behavior. (intel#1538) [SYCL] Fix failing ABI LITs (intel#1622) [SYCL] Add support for MSVC internal math functions in device library (intel#1441) [SYCL] Add runtime library versioning (intel#1604) [SYCL] Check weak symbols in ABI dumps (intel#1609) [NFC][SYCL] Improve kernel metadata test (intel#1610) Revert "[SYCL] XFAIL LIT test due to duplicate diagnostic" (intel#1460) [SYCL] Move the reduction command group funcs out of handler.hpp (intel#1602) ...
This reverts commit a28778c
and fixes the test.
Signed-off-by: Premanand M Rao premanand.m.rao@intel.com