WEVE

Korea-based WEVE develops advanced optical inspection and measurement solutions for Micro-LED manufacturing, providing precision optical metrology systems for next-generation display and compound semiconductor industries.

The company's Micro LED inspection platform integrates Automated Optical Inspection (AOI), photoluminescence (PL), and colorimetric analysis (x,y,Y) to evaluate device structure, emission characteristics, and performance with high speed and accuracy. The system supports inspection from epitaxial wafers to chip-on-wafer (CoW), chip-on-carrier (CoC), and final Micro LED panels, offering non-contact, non-destructive measurement with high throughput.

WEVE also supports simultaneous RGB inspection, machine-learning-assisted defect classification, and flexible recipe configuration to help manufacturers improve yield and accelerate Micro LED commercialization.