{"id":24165204,"date":"2020-04-24T00:01:17","date_gmt":"2020-04-24T07:01:17","guid":{"rendered":"https:\/\/semiengineering.com\/?p=24165204"},"modified":"2020-04-23T15:44:43","modified_gmt":"2020-04-23T22:44:43","slug":"capturing-bugs-visually","status":"publish","type":"post","link":"https:\/\/semiengineering.com\/capturing-bugs-visually\/","title":{"rendered":"Capturing Bugs Visually"},"content":{"rendered":"

This paper presents a new way to comprehend complex scenarios, in order to significantly accelerate bug detection and resolution. By defining a new visual language, which creates interaction vertices between the simulation scenarios and the code structure on a single matrix, we offer a novel way to compare multiple cycles. It enables verification engineers to reach solid conclusions regarding a failure by comparing successful events.<\/p>\n

We propose a novel method that will significantly improve the cycle of failure detection. To read more, click here<\/a>.<\/p>\n","protected":false},"excerpt":{"rendered":"

Using cause-and-effect chains to debug IC designs.<\/p>\n","protected":false},"author":814,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"_jetpack_memberships_contains_paid_content":false,"footnotes":"","jetpack_publicize_message":"","jetpack_publicize_feature_enabled":true,"jetpack_social_post_already_shared":true,"jetpack_social_options":{"image_generator_settings":{"template":"highway","default_image_id":0,"font":"","enabled":false},"version":2}},"categories":[143,4],"tags":[39206,39204,174,6870,39205,5469,18383],"class_list":["post-24165204","post","type-post","status-publish","format-standard","hentry","category-system-level-design-2","category-whitepapers","tag-comparison","tag-data-visualization","tag-debug","tag-machine-learning","tag-matrix","tag-vertex","tag-vtool"],"acf":[],"yoast_head":"\nCapturing Bugs Visually<\/title>\n<meta name=\"description\" content=\"Through chains of cause-and-effect.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/semiengineering.com\/capturing-bugs-visually\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Capturing Bugs Visually\" \/>\n<meta property=\"og:description\" content=\"Through chains of cause-and-effect.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/semiengineering.com\/capturing-bugs-visually\/\" \/>\n<meta property=\"og:site_name\" content=\"Semiconductor Engineering\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/SemiEngineering\" \/>\n<meta property=\"article:published_time\" content=\"2020-04-24T07:01:17+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/semiengineering.com\/wp-content\/uploads\/2017\/05\/semi_fb_thumb.jpg?fit=250%2C250&ssl=1\" 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class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/semiengineering.com\\\/capturing-bugs-visually\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/semiengineering.com\\\/capturing-bugs-visually\\\/\"},\"author\":{\"name\":\"Vtool\",\"@id\":\"https:\\\/\\\/semiengineering.com\\\/#\\\/schema\\\/person\\\/55d5ffe555b0dc1c5a365c983745e247\"},\"headline\":\"Capturing Bugs Visually\",\"datePublished\":\"2020-04-24T07:01:17+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/semiengineering.com\\\/capturing-bugs-visually\\\/\"},\"wordCount\":87,\"commentCount\":0,\"keywords\":[\"comparison\",\"data visualization\",\"debug\",\"machine learning\",\"matrix\",\"Vertex\",\"VTool\"],\"articleSection\":[\"System-Level Design\",\"Whitepapers\"],\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"CommentAction\",\"name\":\"Comment\",\"target\":[\"https:\\\/\\\/semiengineering.com\\\/capturing-bugs-visually\\\/#respond\"]}],\"copyrightYear\":\"2020\",\"copyrightHolder\":{\"@id\":\"https:\\\/\\\/semiengineering.com\\\/#organization\"}},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/semiengineering.com\\\/capturing-bugs-visually\\\/\",\"url\":\"https:\\\/\\\/semiengineering.com\\\/capturing-bugs-visually\\\/\",\"name\":\"Capturing Bugs Visually\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/semiengineering.com\\\/#website\"},\"datePublished\":\"2020-04-24T07:01:17+00:00\",\"author\":{\"@id\":\"https:\\\/\\\/semiengineering.com\\\/#\\\/schema\\\/person\\\/55d5ffe555b0dc1c5a365c983745e247\"},\"description\":\"Through chains of cause-and-effect.\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/semiengineering.com\\\/capturing-bugs-visually\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/semiengineering.com\\\/capturing-bugs-visually\\\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/semiengineering.com\\\/capturing-bugs-visually\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/semiengineering.com\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Capturing Bugs Visually\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/semiengineering.com\\\/#website\",\"url\":\"https:\\\/\\\/semiengineering.com\\\/\",\"name\":\"Semiconductor Engineering\",\"description\":\"Deep Insights For Chip Engineers\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/semiengineering.com\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Person\",\"@id\":\"https:\\\/\\\/semiengineering.com\\\/#\\\/schema\\\/person\\\/55d5ffe555b0dc1c5a365c983745e247\",\"name\":\"Vtool\",\"image\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/secure.gravatar.com\\\/avatar\\\/990e72f5421217d9b381e547b0d188976e60f6d445d7f4e134ccdc54f24400f0?s=96&d=mm&r=g\",\"url\":\"https:\\\/\\\/secure.gravatar.com\\\/avatar\\\/990e72f5421217d9b381e547b0d188976e60f6d445d7f4e134ccdc54f24400f0?s=96&d=mm&r=g\",\"contentUrl\":\"https:\\\/\\\/secure.gravatar.com\\\/avatar\\\/990e72f5421217d9b381e547b0d188976e60f6d445d7f4e134ccdc54f24400f0?s=96&d=mm&r=g\",\"caption\":\"Vtool\"},\"url\":\"https:\\\/\\\/semiengineering.com\\\/author\\\/vtool\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO Premium plugin. -->","yoast_head_json":{"title":"Capturing Bugs Visually","description":"Through chains of cause-and-effect.","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/semiengineering.com\/capturing-bugs-visually\/","og_locale":"en_US","og_type":"article","og_title":"Capturing Bugs Visually","og_description":"Through chains of cause-and-effect.","og_url":"https:\/\/semiengineering.com\/capturing-bugs-visually\/","og_site_name":"Semiconductor Engineering","article_publisher":"https:\/\/www.facebook.com\/SemiEngineering","article_published_time":"2020-04-24T07:01:17+00:00","og_image":[{"width":250,"height":250,"url":"https:\/\/semiengineering.com\/wp-content\/uploads\/2017\/05\/semi_fb_thumb.jpg?fit=250%2C250&ssl=1","type":"image\/jpeg"}],"author":"Vtool","twitter_card":"summary_large_image","twitter_creator":"@SemiEngineering","twitter_site":"@SemiEngineering","twitter_misc":{"Written by":"Vtool"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/semiengineering.com\/capturing-bugs-visually\/#article","isPartOf":{"@id":"https:\/\/semiengineering.com\/capturing-bugs-visually\/"},"author":{"name":"Vtool","@id":"https:\/\/semiengineering.com\/#\/schema\/person\/55d5ffe555b0dc1c5a365c983745e247"},"headline":"Capturing Bugs Visually","datePublished":"2020-04-24T07:01:17+00:00","mainEntityOfPage":{"@id":"https:\/\/semiengineering.com\/capturing-bugs-visually\/"},"wordCount":87,"commentCount":0,"keywords":["comparison","data visualization","debug","machine learning","matrix","Vertex","VTool"],"articleSection":["System-Level Design","Whitepapers"],"inLanguage":"en-US","potentialAction":[{"@type":"CommentAction","name":"Comment","target":["https:\/\/semiengineering.com\/capturing-bugs-visually\/#respond"]}],"copyrightYear":"2020","copyrightHolder":{"@id":"https:\/\/semiengineering.com\/#organization"}},{"@type":"WebPage","@id":"https:\/\/semiengineering.com\/capturing-bugs-visually\/","url":"https:\/\/semiengineering.com\/capturing-bugs-visually\/","name":"Capturing Bugs Visually","isPartOf":{"@id":"https:\/\/semiengineering.com\/#website"},"datePublished":"2020-04-24T07:01:17+00:00","author":{"@id":"https:\/\/semiengineering.com\/#\/schema\/person\/55d5ffe555b0dc1c5a365c983745e247"},"description":"Through chains of cause-and-effect.","breadcrumb":{"@id":"https:\/\/semiengineering.com\/capturing-bugs-visually\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/semiengineering.com\/capturing-bugs-visually\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/semiengineering.com\/capturing-bugs-visually\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/semiengineering.com\/"},{"@type":"ListItem","position":2,"name":"Capturing Bugs Visually"}]},{"@type":"WebSite","@id":"https:\/\/semiengineering.com\/#website","url":"https:\/\/semiengineering.com\/","name":"Semiconductor Engineering","description":"Deep Insights For Chip Engineers","potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/semiengineering.com\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Person","@id":"https:\/\/semiengineering.com\/#\/schema\/person\/55d5ffe555b0dc1c5a365c983745e247","name":"Vtool","image":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/secure.gravatar.com\/avatar\/990e72f5421217d9b381e547b0d188976e60f6d445d7f4e134ccdc54f24400f0?s=96&d=mm&r=g","url":"https:\/\/secure.gravatar.com\/avatar\/990e72f5421217d9b381e547b0d188976e60f6d445d7f4e134ccdc54f24400f0?s=96&d=mm&r=g","contentUrl":"https:\/\/secure.gravatar.com\/avatar\/990e72f5421217d9b381e547b0d188976e60f6d445d7f4e134ccdc54f24400f0?s=96&d=mm&r=g","caption":"Vtool"},"url":"https:\/\/semiengineering.com\/author\/vtool\/"}]}},"jetpack_publicize_connections":[],"jetpack_featured_media_url":"","jetpack_sharing_enabled":true,"jetpack_shortlink":"https:\/\/wp.me\/p9HsLC-1Dotm","_links":{"self":[{"href":"https:\/\/semiengineering.com\/wp-json\/wp\/v2\/posts\/24165204","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/semiengineering.com\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/semiengineering.com\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/semiengineering.com\/wp-json\/wp\/v2\/users\/814"}],"replies":[{"embeddable":true,"href":"https:\/\/semiengineering.com\/wp-json\/wp\/v2\/comments?post=24165204"}],"version-history":[{"count":16,"href":"https:\/\/semiengineering.com\/wp-json\/wp\/v2\/posts\/24165204\/revisions"}],"predecessor-version":[{"id":24165304,"href":"https:\/\/semiengineering.com\/wp-json\/wp\/v2\/posts\/24165204\/revisions\/24165304"}],"wp:attachment":[{"href":"https:\/\/semiengineering.com\/wp-json\/wp\/v2\/media?parent=24165204"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/semiengineering.com\/wp-json\/wp\/v2\/categories?post=24165204"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/semiengineering.com\/wp-json\/wp\/v2\/tags?post=24165204"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}