Using AI/ML To Find And Correlate IC Test Data


What causes low yield in wafers? Usually it's due to design or process changes, but sometimes yield issues occur even if there haven't been any changes from one manufacturing lot to the next. Finding the cause requires some sleuthing, and the best approach for pinpointing problems is to mine design, process, and manufacturing data, and to correlate that data by date and time, by which equipment... » read more

Next Challenge: Known Good Systems


The leading edge of design is heading toward multi-die/multi-chiplet architectures, and an increasing number of mainstream designs likely will follow as processing moves closer to the edge. This doesn't mean every chipmaker will be designing leading-edge chips, of course. But more devices will have at least some leading-edge logic or will be connected over some advanced interconnect scheme t... » read more