Paper – Sofics – Solutions for ICs

Category: Paper

Conference of journal paper

Optimized Local I/O ESD Protection for SerDes In Advanced SOI, BiCMOS and FinFET Technology
Low Capacitive Dual Bipolar ESD Protection
Solving the problems with traditional Silicon Controlled Rectifier (SCR) approaches for ESD
Characterizing the Transient Device Behavior of SCRs by means of VFTLP Waveform Analysis
Using the Voltage and Current Waveforms from VFTLP systems to study transient device behavior