Primarily for testing of LUT mappers. Artificially constructed combinational circuits with known optimum (LEKO) or upper size bound (LEKU).
In formats BLIF, VHDL
More information at https://ddd.fit.cvut.cz/www/prj/Benchmarks/LEKO_LEKU.htm
minkovich/LEKO_LEKU
Folders and files
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