Description

For testing to be performed it must be easy. /dist/tools/compile_and_test_for_board was a stepping stone towards this.

Many boards can now run all tests in a row reliably. But there exception for boards that:

• make reset does not work
  e.g.: arduino, native, z1 (all passing by a BSL)
• make reset blocks
  e.g.: esp32
• make reset causes serial disconnect
  e.g.: atmega2560, mkrwan
• make flash fails without manual intervention
  e.g.: ccs2538dk,
• port with no stdin or stdout
  e.g: all mips

This issue wants to track the needed efforts to be able to achieve this. The following list is not exhaustive at it only involves the issues I'm aware off

Steps

• make reset does not work
  • use test_interactive_sync_util in all possible test, i.e. test not disabling input/output tests: use test_interactive_test_util when possible #12461
  • test application should run in a loop for tests that cant use test_interactive_sync_util (all aplications in tests do this)
• make reset causes serial disconnect
  • use sync functions and disable reset on term
  • wait for terminal to become available
  • reset before opening the terminal.
• make reset blocks
  • not reset when terminal is open
• make flash fails without manual intervention
  • use usb-bootloader
  • blacklist tests that cause hardfaults (tests/ssp)
• general speed ups:
  • get rid of uneeded sleeps when possible.