<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<article key="journals/tr/SiWHZP12" mdate="2024-12-05">
<author orcid="0000-0001-5226-9923">Xiao-Sheng Si</author>
<author>Wenbin Wang 0002</author>
<author>Chang-Hua Hu</author>
<author>Dong-Hua Zhou</author>
<author orcid="0000-0003-1126-8662">Michael G. Pecht</author>
<title>Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process.</title>
<pages>50-67</pages>
<year>2012</year>
<volume>61</volume>
<journal>IEEE Trans. Reliab.</journal>
<number>1</number>
<ee>https://doi.org/10.1109/TR.2011.2182221</ee>
<url>db/journals/tr/tr61.html#SiWHZP12</url>
</article>
</dblp>
