Automatic Defect Classification Using Frequency and Spatial Features in a Boosting Scheme.

Hong Il Kim Sang Hwa Lee Nam Ik Cho Automatic Defect Classification Using Frequency and Spatial Features in a Boosting Scheme. 374-377 2009 16 IEEE Signal Process. Lett. 5 https://doi.org/10.1109/LSP.2009.2016467 db/journals/spl/spl16.html#KimLC09