Simulation Results of an Efficient Defect-Analysis Procedure.

Olaf Stern Hans-Joachim Wunderlich Simulation Results of an Efficient Defect-Analysis Procedure. 729-738 1994 conf/itc/1994 ITC db/conf/itc/itc1994.html#SternW94 https://doi.org/10.1109/TEST.1994.528019 https://doi.ieeecomputersociety.org/10.1109/TEST.1994.528019