<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<inproceedings key="conf/itc/MooreSCFPRFBRFS07" mdate="2023-03-23">
<author>Brian Moore 0001</author>
<author>Chris Sellathamby</author>
<author>Philippe Cauvet</author>
<author>H&#233;rv&#233; Fleury</author>
<author>M. Paulson</author>
<author>Md. Mahbub Reja</author>
<author>Lin Fu</author>
<author>Brenda Bai</author>
<author>Edwin Walter Reid</author>
<author>Igor M. Filanovsky</author>
<author>Steven Slupsky</author>
<title>High throughput non-contact SiP testing.</title>
<pages>1-10</pages>
<year>2007</year>
<booktitle>ITC</booktitle>
<ee>https://doi.org/10.1109/TEST.2007.4437595</ee>
<ee>https://doi.ieeecomputersociety.org/10.1109/TEST.2007.4437595</ee>
<crossref>conf/itc/2007</crossref>
<url>db/conf/itc/itc2007.html#MooreSCFPRFBRFS07</url>
</inproceedings></dblp>
