Florian Chouard Michael Fulde Doris Schmitt-Landsiedel Reliability assessment of voltage controlled oscillators in 32nm high-κ metal gate technology. 410-413 2010 ESSCIRC https://doi.org/10.1109/ESSCIRC.2010.5619730 conf/esscirc/2010 db/conf/esscirc/esscirc2010.html#ChouardFS10