Automatic Test Generation for Maximal Diagnosis of Linear Analogue Circuits.

Salvador Mir Bernard Courtois Marcelo Lubaszewski Vladimir Kolarik Automatic Test Generation for Maximal Diagnosis of Linear Analogue Circuits. 254-258 1996 ED&TC https://doi.org/10.1109/EDTC.1996.494157 https://doi.ieeecomputersociety.org/10.1109/EDTC.1996.494157 https://dl.acm.org/doi/10.5555/787259.787553 conf/date/1996 db/conf/date/edtc1996.html#MirCLK96