Yoshiaki Nishikawa Shohei Maruyama Eiji Takahashi Takeo Onishi Deep-learning-based Estimation of Radio-quality Deterioration Causes for 5G Industrial Applications. 666-667 2023 CCNC https://doi.org/10.1109/CCNC51644.2023.10060500 conf/ccnc/2023 db/conf/ccnc/ccnc2023.html#NishikawaMTO23