A Fault Partitioning Method in Parallel Test Generation for Large Scale VLSI Circuits.

Zhide Zeng Jihua Chen Pengxia Liu A Fault Partitioning Method in Parallel Test Generation for Large Scale VLSI Circuits. 133- 1999 conf/ats/1999 Asian Test Symposium https://doi.org/10.1109/ATS.1999.810741 https://doi.ieeecomputersociety.org/10.1109/ATS.1999.810741 db/conf/ats/ats1999.html#ZengCL99