Dong Xiang Kaiwei Li Hideo Fujiwara Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops. 318-323 2005 conf/ats/2005 Asian Test Symposium https://doi.org/10.1109/ATS.2005.46 https://doi.ieeecomputersociety.org/10.1109/ATS.2005.46 db/conf/ats/ats2005.html#XiangLF05