Shot Noise Modeling in Metal-Oxide-Semiconductor Field Effect Transistors under Sub-Threshold Condition.

Yoshioki Isobe Kiyohito Hara Dondee Navarro Youichi Takeda Tatsuya Ezaki Mitiko Miura-Mattausch Shot Noise Modeling in Metal-Oxide-Semiconductor Field Effect Transistors under Sub-Threshold Condition. 885-894 2007 90-C IEICE Trans. Electron. 4 https://doi.org/10.1093/ietele/e90-c.4.885 db/journals/ieicet/ieicet90c.html#IsobeHNTEM07