A Novel Model for the Resonance Frequency in Lamb Wave Resonators based on AlN.

Alfonso Torres-Jácome A. F. Jaramillo Alvarado Alfonso Torres-Jácome Francisco Javier de la Hidalga Wade Emmanuel Torres-Rios A Novel Model for the Resonance Frequency in Lamb Wave Resonators based on AlN. 161-164 2019 LASCAS https://doi.org/10.1109/LASCAS.2019.8667592 conf/lascas/2019 db/conf/lascas/lascas2019.html#AlvaradoJHR19 Carlos Ramón Báez Álvarez Wilfrido Calleja Arriaga Mónico Linares Aranda Alfonso Torres-Jácome Anisotropic silicon etch to house CMOS compatible MEMS microstructures without planarization techniques. 1-4 2017 CCE https://doi.org/10.1109/ICEEE.2017.8108843 conf/iceee/2017 db/conf/iceee/iceee2017.html#AlvarezAAT17 Carlos Ramón Báez Álvarez Mónico Linares Aranda Alfonso Torres-Jácome Wilfrido Calleja Arriaga Javier de la Hidalga Wade A set of test structures for the development of a CMOS-MEMS technology. 1-6 2016 CCE https://doi.org/10.1109/ICEEE.2016.7751206 conf/iceee/2016 db/conf/iceee/iceee2016.html#AlvarezATAW16 Abel Perez-Fajardo D. M. Cortes-Hernandez Reydezel Torres-Torres Alfonso Torres-Jácome Characterization of transmission lines in a novel high-frequency laminate. 391-394 2016 LASCAS https://doi.org/10.1109/LASCAS.2016.7451092 conf/lascas/2016 db/conf/lascas/lascas2016.html#Perez-FajardoCT16 Carlos Ramón Báez Álvarez Mónico Linares Aranda Alfonso Torres-Jácome Wilfrido Calleja Arriaga Test structures for residual stress monitoring in the integrated CMOS-MEMS process development. 1-4 2016 SMACD https://doi.org/10.1109/SMACD.2016.7520745 conf/smacd/2016 db/conf/smacd/smacd2016.html#AlvarezATA16 Abel Perez-Fajardo Alfonso Torres-Jácome Reydezel Torres-Torres Novel PCB fabrication process roughness free for high frequency applications. 1-3 2015 CCE https://doi.org/10.1109/ICEEE.2015.7357904 conf/iceee/2015 db/conf/iceee/iceee2015.html#Perez-FajardoTT15

Joel Molina Reyes Rene Valderrama Carlos Zuniga Pedro Rosales Wilfrido Calleja Arriaga Alfonso Torres-Jácome Francisco Javier de la Hidalga Wade Edmundo A. Gutiérrez-D. Influence of the surface roughness of the bottom electrode on the resistive-switching characteristics of Al/Al2O3/Al and Al/Al2O3/W structures fabricated on glass at 300 °C. 2747-2753 2014 54 Microelectron. Reliab. 12 https://doi.org/10.1016/j.microrel.2014.07.006 db/journals/mr/mr54.html#ReyesVZRATHG14

J. Plaza Castillo Alfonso Torres-Jácome O. Malik N. Torres López Very shallow boron junctions in Si by implantation and SOD diffusion obtained by RTP. 678-681 2008 39 Microelectron. J. 3-4 https://doi.org/10.1016/j.mejo.2007.07.058 db/journals/mj/mj39.html#CastilloTML08

Jaime Martínez-Castillo Alejandro Díaz-Sánchez Alfonso Torres-Jácome Roberto S. Murphy-Arteaga Jesús L. Finol Bi-CMOS Opto-Electronic Reception System for Application in High-Frequencies. 214-219 2004 conf/conielecomp/2004 CONIELECOMP https://doi.org/10.1109/ICECC.2004.1269575 https://doi.ieeecomputersociety.org/10.1109/ICECC.2004.1269575 db/conf/conielecomp/conielecomp2004.html#Martinez-CastilloDTMF04

Roberto S. Murphy-Arteaga Jesus Huerta-Chua Alejandro Díaz-Sánchez Alfonso Torres-Jácome Wilfrido Calleja Arriaga M. Landa-Vázquez Fabrication, characterisation and modelling of integrated on-silicon inductors. 195-201 2003 43 Microelectron. Reliab. 2 https://doi.org/10.1016/S0026-2714(02)00289-5 db/journals/mr/mr43.html#Murphy-ArteagaHDTCL03

A. F. Jaramillo Alvarado Carlos Ramón Báez Álvarez Mónico Linares Aranda Wilfrido Calleja Arriaga J. Plaza Castillo D. M. Cortes-Hernandez Alejandro Díaz-Sánchez Jesús L. Finol Edmundo A. Gutiérrez-D. Jesus Huerta-Chua M. Landa-Vázquez N. Torres López O. Malik Jaime Martínez-Castillo Roberto S. Murphy-Arteaga Abel Perez-Fajardo Joel Molina Reyes Pedro Rosales Emmanuel Torres-Rios Reydezel Torres-Torres Rene Valderrama Javier de la Hidalga WadeFrancisco Javier de la Hidalga Wade Carlos Zuniga