L. Mazenq
S. Mellé
D. De Conto
L. Mazenq
David Dubuc
B. Poussard
C. Bordas
Katja Grenier
Laurent Bary
Olivier Vendier
J. L. Muraro
Failure predictive model of capacitive RF-MEMS.
1770-1775
2005
45
Microelectron. Reliab.
9-11
https://doi.org/10.1016/j.microrel.2005.07.092
db/journals/mr/mr45.html#MelleCMDPBGBVM05
Laurent Bary
C. Bordas
D. De Conto
David Dubuc
Katia GrenierKatja Grenier
S. Mellé
J. L. Muraro
B. Poussard
Olivier Vendier