G. Néau
G. Néau
Frédéric Martinez
M. Valenza
J. C. Vildeuil
E. Vincent
Frédéric Boeuf
F. Payet
K. Rochereau
Impact of strained-channel n-MOSFETs with a SiGe virtual substrate on dielectric interface quality evaluated by low frequency noise measurements.
567-572
2007
47
Microelectron. Reliab.
4-5
https://doi.org/10.1016/j.microrel.2007.01.079
db/journals/mr/mr47.html#NeauMVVVBPR07
Frédéric Boeuf
Frédéric Martinez
F. Payet
K. Rochereau
M. Valenza
J. C. Vildeuil
E. Vincent