A. Heid
Michael Heer
P. Grombach
A. Heid
Dionyz Pogany
Hot spot analysis during thermal shutdown of SOI BCDMOS half bridge driver for automotive applications.
1525-1528
2008
48
Microelectron. Reliab.
8-9
https://doi.org/10.1016/j.microrel.2008.07.009
db/journals/mr/mr48.html#HeerGHP08
Michael Heer
Sergey Bychikhin
W. Mamanee
Dionyz Pogany
A. Heid
P. Grombach
M. Klaussner
Winfried Soppa
Bernd Ramler
Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices.
1450-1455
2007
47
Microelectron. Reliab.
9-11
https://doi.org/10.1016/j.microrel.2007.07.092
db/journals/mr/mr47.html#HeerBMPHGKSR07
Sergey Bychikhin
P. Grombach
Michael Heer
M. Klaussner
W. Mamanee
Dionyz Pogany
Bernd Ramler
Winfried Soppa