X. Chauffleur
Pierre Solomalala
J. Saiz
Michel Mermet-Guyennet
Alberto Castellazzi
Mauro Ciappa
X. Chauffleur
Jean-Pierre Fradin
Virtual reliability assessment of integrated power switches based on multi-domain simulation approach.
1343-1348
2007
47
Microelectron. Reliab.
9-11
https://doi.org/10.1016/j.microrel.2007.07.006
db/journals/mr/mr47.html#SolomalalaSMCCCF07
B. Khong
Marc Legros
Patrick Tounsi
Philippe Dupuy
X. Chauffleur
Colette Levade
G. Vanderschaeve
Emmanuel Scheid
Characterization and modelling of ageing failures on power MOSFET devices.
1735-1740
2007
47
Microelectron. Reliab.
9-11
https://doi.org/10.1016/j.microrel.2007.07.055
db/journals/mr/mr47.html#KhongLTDCLVS07
B. Khong
Patrick Tounsi
Philippe Dupuy
X. Chauffleur
Marc Legros
A. Deram
Colette Levade
G. Vanderschaeve
Jean-Marie Dorkel
Jean-Pierre Fradin
Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue.
1717-1722
2005
45
Microelectron. Reliab.
9-11
https://doi.org/10.1016/j.microrel.2005.07.104
db/journals/mr/mr45.html#KhongTDCLDLVDF05
Felix Beaudoin
X. Chauffleur
Jean-Pierre Fradin
Philippe Perdu
Romain Desplats
Dean Lewis
Modeling Thermal Laser Stimulation.
1477-1482
2001
41
Microelectron. Reliab.
9-10
db/journals/mr/mr41.html#BeaudoinCFPDL01
https://doi.org/10.1016/S0026-2714(01)00202-5
Felix Beaudoin
Alberto Castellazzi
Mauro Ciappa
A. Deram
Romain Desplats
Jean-Marie Dorkel
Philippe Dupuy
Jean-Pierre Fradin
B. Khong
Marc Legros
Colette Levade
Dean Lewis
Michel Mermet-Guyennet
Philippe Perdu
J. Saiz
Emmanuel Scheid
Pierre Solomalala
Patrick Tounsi
G. Vanderschaeve