Guest Editorial: Analog, Mixed-Signal and RF Testing.

Carsten Wegener

Gildas Léger Carsten Wegener Guest Editorial: Analog, Mixed-Signal and RF Testing. 405-406 2016 32 J. Electron. Test. 4 https://doi.org/10.1007/s10836-016-5608-y db/journals/et/et32.html#LegerW16

Carsten Wegener Method of modeling analog circuits in verilog for mixed-signal design simulations. 1-5 2013 ECCTD https://doi.org/10.1109/ECCTD.2013.6662227 conf/ecctd/2013 db/conf/ecctd/ecctd2013.html#Wegener13

Esa Korhonen Carsten Wegener Juha Kostamovaara Combining the Standard Histogram Method and a Stimulus Identification Algorithm for A/D Converter INL Testing With a Low-Quality Sine Wave Stimulus. 1166-1174 2010 57-I IEEE Trans. Circuits Syst. I Regul. Pap. 6 https://doi.org/10.1109/TCSI.2009.2030096 db/journals/tcas/tcasI57.html#KorhonenWK10

Carsten Wegener Heinz Mattes Stéphane Kirmser Frank Demmerle Sebastian Sattler Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores. 301-308 2009 25 J. Electron. Test. 6 https://doi.org/10.1007/s10836-009-5118-2 db/journals/et/et25.html#WegenerMKDS09

Reik Müller Carsten Wegener Hans-Joachim Jentschel Sebastian Sattler Heinz Mattes An approach to linear model-based testing for nonlinear cascaded mixed-signal systems. 1662-1667 2009 DATE https://doi.org/10.1109/DATE.2009.5090930 http://dl.acm.org/citation.cfm?id=1875017 conf/date/2009 db/conf/date/date2009.html#MullerWJSM09

Carsten Wegener Michael Peter Kennedy Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing. 513-525 2007 23 J. Electron. Test. 6 https://doi.org/10.1007/s10836-007-5050-2 db/journals/et/et23.html#WegenerK07

Carsten Wegener Michael Peter Kennedy Test Development Through Defect and Test Escape Level Estimation for Data Converters. 313-324 2006 22 J. Electron. Test. 4-6 https://doi.org/10.1007/s10836-006-9457-y db/journals/et/et22.html#WegenerK06

Carsten Wegener Michael Peter Kennedy Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs. 299-310 2005 21 J. Electron. Test. 3 https://doi.org/10.1007/s10836-005-6359-3 db/journals/et/et21.html#WegenerK05

Carsten Wegener Michael Peter Kennedy Innovation to overcome limitations of test equipment. 309-314 2005 ECCTD https://doi.org/10.1109/ECCTD.2005.1522972 conf/ecctd/2005 db/conf/ecctd/ecctd2005.html#WegenerK05

Carsten Wegener Michael Peter Kennedy Testing ADCs for static and dynamic INL - killing two birds with one stone. 15-20 2004 26 Comput. Stand. Interfaces 1 https://doi.org/10.1016/S0920-5489(03)00058-8 db/journals/csi/csi26.html#WegenerK04

Carsten Wegener Michael Peter Kennedy Linear model-based testing of ADC nonlinearities. 213-217 2004 51-I IEEE Trans. Circuits Syst. I Regul. Pap. 1 https://doi.org/10.1109/TCSI.2003.821281 db/journals/tcas/tcasI51.html#WegenerK04

Carsten Wegener Michael Peter Kennedy Linear Model-Based Error Identification and Calibration for Data Converters. 10630-10635 2003 conf/date/2003 DATE https://doi.ieeecomputersociety.org/10.1109/DATE.2003.10041 http://dl.acm.org/citation.cfm?id=1022796 db/conf/date/date2003.html#WegenerK03 Gwenolé Maugard Carsten Wegener Tom O'Dwyer Michael Peter Kennedy Method of reducing contactor effect when testing high-precision ADCs. 210-217 2003 conf/itc/2003 ITC https://doi.org/10.1109/TEST.2003.1270842 https://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270842 db/conf/itc/itc2003.html#MaugardWOK03 Carsten Wegener Michael Peter Kennedy Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs. 851-860 2002 conf/itc/2002 ITC https://doi.org/10.1109/TEST.2002.1041839 https://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041839 db/conf/itc/itc2002.html#WegenerK02

Carsten Wegener Michael Peter Kennedy Bernd Straube Process Deviations and Spot Defects: Two Aspects of Test and Test Development for Mixed-Signal Circuits. 409-416 2001 17 J. Electron. Test. 5 https://doi.org/10.1023/A:1012703202816 db/journals/et/et17.html#WegenerKS01

Carsten Wegener Michael Peter Kennedy Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs. 765 2000 conf/date/2000 DATE https://doi.org/10.1109/DATE.2000.840898 https://doi.ieeecomputersociety.org/10.1109/DATE.2000.840898 https://doi.org/10.1145/343647.344353 db/conf/date/date2000.html#WegenerK00 Carsten Wegener Michael Peter Kennedy Model-based testing of high-resolution ADCs. 335-338 2000 ISCAS https://doi.org/10.1109/ISCAS.2000.857098 conf/iscas/2000 db/conf/iscas/iscas2000.html#WegenerK00 Frank Demmerle Hans-Joachim Jentschel Michael Peter Kennedy Stéphane Kirmser Esa Korhonen Juha Kostamovaara Gildas Léger Heinz Mattes Gwenolé Maugard Reik Müller Tom O'Dwyer Sebastian Sattler Bernd Straube