Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization.

A. Podgaynaya

A. Podgaynaya Ralf Rudolf B. Elattari Dionyz Pogany Erich Gornik Matthias Stecher Marc Strasser Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization. 1347-1351 2010 50 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2010.07.075 https://www.wikidata.org/entity/Q110626900 db/journals/mr/mr50.html#PodgaynayaREPGSS10

Georg Haberfehlner Sergey Bychikhin Viktor Dubec Michael Heer A. Podgaynaya M. Pfost Matthias Stecher Erich Gornik Dionyz Pogany Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. 1346-1351 2009 49 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2009.07.032 https://www.wikidata.org/entity/Q110626906 db/journals/mr/mr49.html#HaberfehlnerBDHPPSGP09

Sergey Bychikhin Viktor Dubec B. Elattari Erich Gornik Georg Haberfehlner Michael Heer M. Pfost Dionyz Pogany Ralf Rudolf Matthias Stecher Marc Strasser