Mohamed Akli Belkhir
W. Tazibt
P. Mialhe
J. P. Charles
Mohamed Akli Belkhir
A junction characterization for microelectronic devices quality and reliability.
348-353
2008
48
Microelectron. Reliab.
3
https://doi.org/10.1016/j.microrel.2007.06.002
db/journals/mr/mr48.html#TazibtMCB08
J. P. Charles
P. Mialhe
W. Tazibt