A. Repchankova
Jacopo Iannacci
Alessandro Faes
A. Repchankova
Augusto Tazzoli
Gaudenzio Meneghesso
An active heat-based restoring mechanism for improving the reliability of RF-MEMS switches.
1869-1873
2011
51
Microelectron. Reliab.
9-11
https://doi.org/10.1016/j.microrel.2011.06.019
db/journals/mr/mr51.html#IannacciFRTM11
Jacopo Iannacci
A. Repchankova
Alessandro Faes
Augusto Tazzoli
Gaudenzio Meneghesso
Gian-Franco Dalla Betta
Enhancement of RF-MEMS switch reliability through an active anti-stiction heat-based mechanism.
1599-1603
2010
50
Microelectron. Reliab.
9-11
https://doi.org/10.1016/j.microrel.2010.07.108
db/journals/mr/mr50.html#IannacciRFTMB10
Gian-Franco Dalla Betta
Alessandro Faes
Jacopo Iannacci
Gaudenzio Meneghesso
Augusto Tazzoli