Bahman Honari
Jian Wan 0002
Bahman Honari
Seán F. McLoone
A dynamic sampling methodology for plasma etch processes using Gaussian process regression.
1-6
2013
ICAT
https://doi.org/10.1109/ICAT.2013.6684080
https://doi.ieeecomputersociety.org/10.1109/ICAT.2013.6684080
https://www.wikidata.org/entity/Q59297370
conf/icatech/2013
db/conf/icatech/icatech2013.html#WanHM13
Bahman Honari
John Donovan
Toby Joyce
Simon P. Wilson 0001
Eamonn Murphy
Stress test optimization using an integrated production test and field reliability model.
579-592
2010
26
Qual. Reliab. Eng. Int.
6
https://doi.org/10.1002/qre.1081
db/journals/qre/qre26.html#HonariDJWM10
John Donovan
Toby Joyce
Seán F. McLoone
Eamonn Murphy
Jian Wan 0002
Simon P. Wilson 0001