Gaëtan Math
Christelle Bénard
Gaëtan Math
Pascal Fornara
Jean-Luc Ogier
Didier Goguenheim
Influence of various process steps on the reliability of PMOSFETs submitted to negative bias temperature instabilities.
1008-1012
2009
49
Microelectron. Reliab.
9-11
https://doi.org/10.1016/j.microrel.2009.06.022
db/journals/mr/mr49.html#BenardMFOG09
Christelle Bénard
Pascal Fornara
Didier Goguenheim
Jean-Luc Ogier