Y. Bilenko
Matteo Meneghini
Diego Barbisan
Y. Bilenko
Maxim S. Shatalov
J. Yang
R. Gaska
Gaudenzio Meneghesso
Enrico Zanoni
Defect-related degradation of Deep-UV-LEDs.
1538-1542
2010
50
Microelectron. Reliab.
9-11
https://doi.org/10.1016/j.microrel.2010.07.089
db/journals/mr/mr50.html#MeneghiniBBSYGMZ10
Diego Barbisan
R. Gaska
Gaudenzio Meneghesso
Matteo Meneghini
Maxim S. Shatalov
J. Yang
Enrico Zanoni