Nonlinearity of the NIST Calculable Capacitor.

Anne-Marie Jeffery

Yicheng Wang Zhuang Fu Mathieu Durand Anne-Marie Jeffery Nonlinearity of the NIST Calculable Capacitor. 1895-1900 2019 68 IEEE Trans. Instrum. Meas. 6 https://doi.org/10.1109/TIM.2018.2890745 db/journals/tim/tim68.html#WangFDJ19

Anne-Marie Jeffery Andrew D. Koffman Improved 1-kHz capacitance calibration uncertainty. 1284-1288 2003 52 IEEE Trans. Instrum. Meas. 4 https://doi.org/10.1109/TIM.2003.816810 db/journals/tim/tim52.html#JefferyK03

Randolph E. Elmquist Anne-Marie Jeffery Dean G. Jarrett Characterization of four-terminal-pair resistance standards: a comparison of measurements and theory. 267-271 2001 50 IEEE Trans. Instrum. Meas. 2 https://doi.org/10.1109/19.918118 db/journals/tim/tim50.html#ElmquistJJ01

Anne-Marie Jeffery Lai H. Lee John Q. Shields Model tests to investigate the effects of geometrical imperfections on the NIST calculable capacitor. 356-359 1999 48 IEEE Trans. Instrum. Meas. 2 https://doi.org/10.1109/19.769600 db/journals/tim/tim48.html#JefferyLS99

Mathieu Durand Randolph E. Elmquist Zhuang Fu Dean G. Jarrett Andrew D. Koffman Lai H. Lee John Q. Shields Yicheng Wang