BTI Arbitrary Stress Patterns Characterization & Machine-Learning optimized CET Maps Simulations.

E. Vincent Louis Gerrer Jacques Cluzel Fred Gaillard Xavier Garros Xavier Federspiel Florian Cacho David Roy 0001 E. Vincent BTI Arbitrary Stress Patterns Characterization & Machine-Learning optimized CET Maps Simulations. 1-5 2021 IRPS https://doi.org/10.1109/IRPS46558.2021.9405145 conf/irps/2021 db/conf/irps/irps2021.html#GerrerCGGFCRV21

Xavier Garros Antoine Laurent Alexandre Subirats X. Federspiel E. Vincent Gilles Reimbold Characterization and modeling of dynamic variability induced by BTI in nano-scaled transistors. 100-108 2018 80 Microelectron. Reliab. https://doi.org/10.1016/j.microrel.2017.11.025 db/journals/mr/mr80.html#GarrosLSFVR18

Antoine Laurent Xavier Garros Sylvain Barraud J. Pelloux-Prayer Mikaël Cassé Fred Gaillard X. Federspiel David Roy 0001 E. Vincent Gérard Ghibaudo Performance & reliability of 3D architectures (πfet, Finfet, Ωfet). 6 2018 IRPS https://doi.org/10.1109/IRPS.2018.8353647 conf/irps/2018 db/conf/irps/irps2018.html#LaurentGBPCGFRV18

L. Gerrer M. Rafik G. Ribes Gérard Ghibaudo E. Vincent Unified soft breakdown MOSFETs compact model: From experiments to circuit simulation. 1259-1262 2010 50 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2010.07.143 db/journals/mr/mr50.html#GerrerRRGV10

G. Néau Frédéric Martinez M. Valenza J. C. Vildeuil E. Vincent Frédéric Boeuf F. Payet K. Rochereau Impact of strained-channel n-MOSFETs with a SiGe virtual substrate on dielectric interface quality evaluated by low frequency noise measurements. 567-572 2007 47 Microelectron. Reliab. 4-5 https://doi.org/10.1016/j.microrel.2007.01.079 db/journals/mr/mr47.html#NeauMVVVBPR07

C. R. Parthasarathy Mickael Denais Vincent Huard G. Ribes David Roy 0001 Chloe Guérin F. Perrier E. Vincent Alain Bravaix Designing in reliability in advanced CMOS technologies. 1464-1471 2006 46 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2006.07.012 db/journals/mr/mr46.html#ParthasarathyDHRRGPVB06

Vincent Huard Mickael Denais F. Perrier Nathalie Revil C. R. Parthasarathy Alain Bravaix E. Vincent A thorough investigation of MOSFETs NBTI degradation. 83-98 2005 45 Microelectron. Reliab. 1 https://doi.org/10.1016/j.microrel.2004.04.027 db/journals/mr/mr45.html#HuardDPRPBV05

Alain Bravaix Didier Goguenheim Mickael Denais Vincent Huard C. R. Parthasarathy F. Perrier Nathalie Revil E. Vincent Impacts of the recovery phenomena on the worst-case of damage in DC/AC stressed ultra-thin NO gate-oxide MOSFETs. 1370-1375 2005 45 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2005.07.023 db/journals/mr/mr45.html#BravaixGDHPPRV05

Alain Bravaix Didier Goguenheim Nathalie Revil E. Vincent Hole injection enhanced hot-carrier degradation in PMOSFETs used for systems on chip applications with 6.5-2 nm thick gate-oxides. 65-77 2004 44 Microelectron. Reliab. 1 https://doi.org/10.1016/j.microrel.2003.10.002 db/journals/mr/mr44.html#BravaixGRV04

Gérard Ghibaudo E. Vincent Guest Editorial. 1173 2003 43 Microelectron. Reliab. 8 https://doi.org/10.1016/S0026-2714(03)00168-9 db/journals/mr/mr43.html#GhibaudoV03

Frederic Monsieur E. Vincent Vincent Huard S. Bruyère David Roy 0001 Thomas Skotnicki G. Pananakakis Gérard Ghibaudo On the role of holes in oxide breakdown mechanism in inverted nMOSFETs. 1199-1202 2003 43 Microelectron. Reliab. 8 https://doi.org/10.1016/S0026-2714(03)00172-0 db/journals/mr/mr43.html#MonsieurVHBRSPG03

C. Besset S. Bruyère S. Blonkowski S. Crémer E. Vincent MIM capacitance variation under electrical stress. 1237-1240 2003 43 Microelectron. Reliab. 8 https://doi.org/10.1016/S0026-2714(03)00177-X db/journals/mr/mr43.html#BessetBBCV03

Alain Bravaix C. Trapes Didier Goguenheim Nathalie Revil E. Vincent Carrier injection efficiency for the reliability study of 3.5-1.2 nm thick gate-oxide CMOS technologies. 1241-1246 2003 43 Microelectron. Reliab. 8 https://doi.org/10.1016/S0026-2714(03)00178-1 db/journals/mr/mr43.html#BravaixTGRV03

David Roy 0001 S. Bruyère E. Vincent Frederic Monsieur Series resistance and oxide thickness spread influence on Weibull breakdown distribution: New experimental correction for reliability projection improvement. 1497-1500 2002 42 Microelectron. Reliab. 9-11 https://doi.org/10.1016/S0026-2714(02)00177-4 db/journals/mr/mr42.html#RoyBVM02

Frederic Monsieur E. Vincent David Roy 0001 S. Bruyère G. Pananakakis Gérard Ghibaudo Gate oxide Reliability assessment optimization. 1505-1508 2002 42 Microelectron. Reliab. 9-11 https://doi.org/10.1016/S0026-2714(02)00179-8 db/journals/mr/mr42.html#MonsieurVRBPG02

Sylvie Bruyère David Roy 0001 E. Robilliart E. Vincent Gérard Ghibaudo Body effect induced wear-out acceleration in ultra-thin oxides. 1031-1034 2001 41 Microelectron. Reliab. 7 https://doi.org/10.1016/S0026-2714(01)00065-8 https://www.wikidata.org/entity/Q126865304 db/journals/mr/mr41.html#BruyereRRVG01

Frederic Monsieur E. Vincent G. Pananakakis Gérard Ghibaudo Wear-out, breakdown occurrence and failure detection in 18-25 Å ultrathin oxides. 1035-1039 2001 41 Microelectron. Reliab. 7 https://doi.org/10.1016/S0026-2714(01)00064-6 db/journals/mr/mr41.html#MonsieurVPG01

Frederic Monsieur E. Vincent David Roy 0001 S. Bruyère G. Pananakakis Gérard Ghibaudo Determination of Dielectric Breakdown Weibull Distribution Parameters Confidence Bounds for Accurate Ultrathin Oxide Reliability Predictions. 1295-1300 2001 41 Microelectron. Reliab. 9-10 db/journals/mr/mr41.html#MonsieurVRBPG01 https://doi.org/10.1016/S0026-2714(01)00183-4

Alain Bravaix Didier Goguenheim Nathalie Revil E. Vincent Injection Mechanisms and Lifetime Prediction with the Substrate Voltage in 0.15mum Channel-Length N-MOSFETs. 1313-1318 2001 41 Microelectron. Reliab. 9-10 db/journals/mr/mr41.html#BravaixGRV01 https://doi.org/10.1016/S0026-2714(01)00206-2

S. Bruyère Frederic Monsieur David Roy 0001 E. Vincent Gérard Ghibaudo Failures in ultrathin oxides: Stored energy or carrier energy driven? 1367-1372 2001 41 Microelectron. Reliab. 9-10 db/journals/mr/mr41.html#BruyereMRVG01 https://doi.org/10.1016/S0026-2714(01)00142-1 https://www.wikidata.org/entity/Q126553953

Sylvain Barraud C. Besset S. Blonkowski Frédéric Boeuf Alain Bravaix S. Bruyère Sylvie Bruyère Florian Cacho Mikaël Cassé Jacques Cluzel S. Crémer Mickael Denais X. FederspielXavier Federspiel Fred Gaillard Xavier Garros L. Gerrer Louis Gerrer Gérard Ghibaudo Didier Goguenheim Chloe Guérin Vincent Huard Antoine Laurent Frédéric Martinez Frederic Monsieur G. Néau G. Pananakakis C. R. Parthasarathy F. Payet J. Pelloux-Prayer F. Perrier M. Rafik Gilles Reimbold Nathalie Revil G. Ribes E. Robilliart K. Rochereau David Roy 0001 Thomas Skotnicki Alexandre Subirats C. Trapes M. Valenza J. C. Vildeuil