Hot-carrier reliability of 20V MOS transistors in 0.13 mum CMOS technology.

Yannick Rey-Tauriac J. Badoc B. Reynard Raúl Andrés Bianchi D. Lachenal Alain Bravaix Hot-carrier reliability of 20V MOS transistors in 0.13 mum CMOS technology. 1349-1354 2005 45 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2005.07.019 db/journals/mr/mr45.html#Rey-TauriacBRBLB05