Frédéric Wyczisk
Michele Piazza
Christian Dua
Mourad Oualli
Erwan Morvan
Dominique Carisetti
Frédéric Wyczisk
Degradation of TiAlNiAu as ohmic contact metal for GaN HEMTs.
1222-1225
2009
49
Microelectron. Reliab.
9-11
https://doi.org/10.1016/j.microrel.2009.06.043
db/journals/mr/mr49.html#PiazzaDOMCW09
Dominique Carisetti
Christian Dua
Erwan Morvan
Mourad Oualli
Michele Piazza