<?xml version="1.0"?>
<dblpperson name="M. Brizoux" pid="52/3045" n="4">
<person key="homepages/52/3045" mdate="2009-06-09">
<author pid="52/3045">M. Brizoux</author>
</person>
<r><article key="journals/mr/KpobieMMLBEB16" mdate="2026-02-01">
<author orcid="0000-0001-5137-2822" pid="373/2020">Wiyao Kpobie</author>
<author pid="373/2370">Marion Martiny</author>
<author orcid="0000-0002-5640-3306" pid="149/4822">Sebastien Mercier</author>
<author pid="373/2294">Fran&#231;ois Lechleiter</author>
<author pid="373/2397">Laurent Bodin</author>
<author pid="373/2394">Aur&#233;lien Lecavelier des Etangs-Levallois</author>
<author pid="52/3045">M. Brizoux</author>
<title>Thermo-mechanical simulation of PCB with embedded components.</title>
<pages>108-130</pages>
<year>2016</year>
<volume>65</volume>
<journal>Microelectron. Reliab.</journal>
<ee>https://doi.org/10.1016/j.microrel.2016.08.016</ee>
<url>db/journals/mr/mr65.html#KpobieMMLBEB16</url>
</article>
</r>
<r><article key="journals/mr/DompierreFBAC10" mdate="2023-08-26">
<author pid="20/8566">B. Dompierre</author>
<author pid="15/5250">W. C. Maia Filho</author>
<author pid="52/3045">M. Brizoux</author>
<author orcid="0000-0003-4181-0977" pid="76/8564">V&#233;ronique Aubin</author>
<author orcid="0000-0003-2963-8780" pid="42/8564">Eric Charkaluk</author>
<title>Thermal ageing induces drastic changes on mechanical and damage behavior of Sn3.0Ag0.5Cu alloy.</title>
<pages>1661-1665</pages>
<year>2010</year>
<volume>50</volume>
<journal>Microelectron. Reliab.</journal>
<number>9-11</number>
<ee>https://doi.org/10.1016/j.microrel.2010.07.125</ee>
<url>db/journals/mr/mr50.html#DompierreFBAC10</url>
</article>
</r>
<r><article key="journals/mr/FilhoBFD07" mdate="2020-02-22">
<author pid="15/5250">W. C. Maia Filho</author>
<author pid="52/3045">M. Brizoux</author>
<author pid="10/1947">H&#233;l&#232;ne Fr&#233;mont</author>
<author pid="40/598">Yves Danto</author>
<title>Torsion test applied for reballing and solder paste volume evaluation.</title>
<pages>1663-1667</pages>
<year>2007</year>
<volume>47</volume>
<journal>Microelectron. Reliab.</journal>
<number>9-11</number>
<ee>https://doi.org/10.1016/j.microrel.2007.07.028</ee>
<url>db/journals/mr/mr47.html#FilhoBFD07</url>
</article>
</r>
<r><article key="journals/mr/FilhoBFD06" mdate="2020-02-22">
<author pid="15/5250">W. C. Maia Filho</author>
<author pid="52/3045">M. Brizoux</author>
<author pid="10/1947">H&#233;l&#232;ne Fr&#233;mont</author>
<author pid="40/598">Yves Danto</author>
<title>Improved physical understanding of intermittent failure in continuous monitoring method.</title>
<pages>1886-1891</pages>
<year>2006</year>
<volume>46</volume>
<journal>Microelectron. Reliab.</journal>
<number>9-11</number>
<ee>https://doi.org/10.1016/j.microrel.2006.07.086</ee>
<url>db/journals/mr/mr46.html#FilhoBFD06</url>
</article>
</r>
<coauthors n="12" nc="2">
<co c="0"><na f="a/Aubin:V=eacute=ronique" pid="76/8564">V&#233;ronique Aubin</na></co>
<co c="1"><na f="b/Bodin:Laurent" pid="373/2397">Laurent Bodin</na></co>
<co c="0"><na f="c/Charkaluk:Eric" pid="42/8564">Eric Charkaluk</na></co>
<co c="0"><na f="d/Danto:Yves" pid="40/598">Yves Danto</na></co>
<co c="0"><na f="d/Dompierre:B=" pid="20/8566">B. Dompierre</na></co>
<co c="1"><na f="e/Etangs=Levallois:Aur=eacute=lien_Lecavelier_des" pid="373/2394">Aur&#233;lien Lecavelier des Etangs-Levallois</na></co>
<co c="0"><na f="f/Filho:W=_C=_Maia" pid="15/5250">W. C. Maia Filho</na></co>
<co c="0"><na f="f/Fr=eacute=mont:H=eacute=l=egrave=ne" pid="10/1947">H&#233;l&#232;ne Fr&#233;mont</na></co>
<co c="1"><na f="k/Kpobie:Wiyao" pid="373/2020">Wiyao Kpobie</na></co>
<co c="1"><na f="l/Lechleiter:Fran=ccedil=ois" pid="373/2294">Fran&#231;ois Lechleiter</na></co>
<co c="1"><na f="m/Martiny:Marion" pid="373/2370">Marion Martiny</na></co>
<co c="1"><na f="m/Mercier:Sebastien" pid="149/4822">Sebastien Mercier</na></co>
</coauthors>
</dblpperson>

