Eric Charkaluk
Stephane Zanella
A. Lecavelier des Etangs-Levallois
Eric Charkaluk
W. C. Maia Filho
Andrei Constantinescu 0002
Importance of electric resistance monitoring in shear test.
733-737
2018
88-90
Microelectron. Reliab.
https://doi.org/10.1016/j.microrel.2018.06.063
db/journals/mr/mr88.html#ZanellaECFC18
B. Dompierre
W. C. Maia Filho
M. Brizoux
Véronique Aubin
Eric Charkaluk
Thermal ageing induces drastic changes on mechanical and damage behavior of Sn3.0Ag0.5Cu alloy.
1661-1665
2010
50
Microelectron. Reliab.
9-11
https://doi.org/10.1016/j.microrel.2010.07.125
db/journals/mr/mr50.html#DompierreFBAC10
Véronique Aubin
M. Brizoux
Andrei Constantinescu 0002
B. Dompierre
A. Lecavelier des Etangs-Levallois
W. C. Maia Filho
Stephane Zanella