Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip.

Sejang Oh

Kihyuk Han Joonsung Park Jae Wook Lee Jaeyong Chung Eonjo Byun Cheol-Jong Woo Sejang Oh Jacob A. Abraham Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. 429-439 2011 27 J. Electron. Test. 4 https://doi.org/10.1007/s10836-011-5213-z db/journals/et/et27.html#HanPLCBWOA11

Joonsung Park Jae Wook Lee Jaeyong Chung Kihyuk Han Jacob A. Abraham Eonjo Byun Cheol-Jong Woo Sejang Oh At-speed Test of High-Speed DUT Using Built-Off Test Interface. 269-274 2010 Asian Test Symposium https://doi.org/10.1109/ATS.2010.54 https://doi.ieeecomputersociety.org/10.1109/ATS.2010.54 conf/ats/2010 db/conf/ats/ats2010.html#ParkLCHABWO10 Kihyuk Han Joonsung Park Jae Wook Lee Jacob A. Abraham Eonjo Byun Cheol-Jong Woo Sejang Oh Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. 129-134 2009 ETS https://doi.org/10.1109/ETS.2009.20 https://doi.ieeecomputersociety.org/10.1109/ETS.2009.20 conf/ets/2009 db/conf/ets/ets2009.html#HanPLABWO09 Jacob A. Abraham Eonjo Byun Jaeyong Chung Kihyuk Han Jae Wook Lee Joonsung Park Cheol-Jong Woo