L. Gerrer
L. Gerrer
M. Rafik
G. Ribes
Gérard Ghibaudo
E. Vincent
Unified soft breakdown MOSFETs compact model: From experiments to circuit simulation.
1259-1262
2010
50
Microelectron. Reliab.
9-11
https://doi.org/10.1016/j.microrel.2010.07.143
db/journals/mr/mr50.html#GerrerRRGV10
S. Leconte
L. Gerrer
Eva Monroy
Electronic transport through GaN/AlN single barriers: Effect of polarisation and dislocations.
339-341
2009
40
Microelectron. J.
2
https://doi.org/10.1016/j.mejo.2008.07.066
https://www.wikidata.org/entity/Q58463465
db/journals/mj/mj40.html#LeconteGM09
L. Gerrer
Gérard Ghibaudo
G. Ribes
Oxide Soft Breakdown : From device modeling to small circuit simulation.
368-371
2009
ESSCIRC
https://doi.org/10.1109/ESSCIRC.2009.5325941
conf/esscirc/2009
db/conf/esscirc/esscirc2009.html#GerrerGR09
Gérard Ghibaudo
S. Leconte
Eva Monroy
M. Rafik
G. Ribes
E. Vincent