Stéphane Kirmser
Carsten Wegener
Heinz Mattes
Stéphane Kirmser
Frank Demmerle
Sebastian Sattler
Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores.
301-308
2009
25
J. Electron. Test.
6
https://doi.org/10.1007/s10836-009-5118-2
db/journals/et/et25.html#WegenerMKDS09
Heinz Mattes
Stéphane Kirmser
Sebastian Sattler
Next Generation ADC Massive Parallel Testing with Real Time Parameter Evaluation.
337-350
2006
22
J. Electron. Test.
4-6
https://doi.org/10.1007/s10836-006-9501-y
db/journals/et/et22.html#MattesKS06
Frank Demmerle
Heinz Mattes
Sebastian Sattler
Carsten Wegener