Metric Learning-Guided Semi-Supervised Path-Interaction Fault Diagnosis Method for Extremely Limited Labeled Samples under Variable Working Conditions.

Zheng Yang Fei Chen Binbin Xu Boquan Ma Zege Qu Xin Zhou Metric Learning-Guided Semi-Supervised Path-Interaction Fault Diagnosis Method for Extremely Limited Labeled Samples under Variable Working Conditions. 6951 2023 August 23 Sensors 15 https://doi.org/10.3390/s23156951 db/journals/sensors/sensors23.html#YangCXMQZ23