C. Ollivier
Benoit Lambert
G. Jonsson
J. Bataille
C. Ollivier
P. Mezenge
H. Derewonko
H. Thomas
D. Floriot
Hervé Blanck
C. Moreau
Reliability of high voltage/high power L/S-band Hbt technology.
1543-1547
2010
50
Microelectron. Reliab.
9-11
https://doi.org/10.1016/j.microrel.2010.07.105
db/journals/mr/mr50.html#LambertJBOMDTFBM10
J. Bataille
Hervé Blanck
H. Derewonko
D. Floriot
G. Jonsson
Benoit Lambert
P. Mezenge
C. Moreau
H. Thomas