Highlighting two integration technologies based on vias: Through silicon vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability.

Laurent Béchou

M. Balmont Isabelle Bord-Majek B. Poupard Laurent Béchou Yves Ousten Highlighting two integration technologies based on vias: Through silicon vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability. 1108-1112 2018 88-90 Microelectron. Reliab. https://doi.org/10.1016/j.microrel.2018.06.077 db/journals/mr/mr88.html#BalmontBPBO18

Massimo Vanzi Giulia Marcello Giovanna Mura G. Le Galès S. Joly Yannick Deshayes Laurent Béchou Practical optical gain by an extended Hakki-Paoli method. 579-583 2017 76-77 Microelectron. Reliab. https://doi.org/10.1016/j.microrel.2017.07.060 db/journals/mr/mr76.html#VanziMMGJDB17

Pamela Del Vecchio Arnaud Curutchet Yannick Deshayes M. Bettiati F. Laruelle Nathalie Labat Laurent Béchou Correlation between forward-reverse low-frequency noise and atypical I-V signatures in 980 nm high-power laser diodes. 1741-1745 2015 55 Microelectron. Reliab. 9-10 https://doi.org/10.1016/j.microrel.2015.06.041 db/journals/mr/mr55.html#VecchioCDBLLB15

Jérémy Michaud Guillaume Pedroza Laurent Béchou L. S. How Olivier Gilard David Veyrié F. Laruelle Stéphane Grauby Investigations on electro-optical and thermal performances degradation of high power density GaAs-based laser diode in vacuum environment. 1746-1749 2015 55 Microelectron. Reliab. 9-10 https://doi.org/10.1016/j.microrel.2015.06.068 db/journals/mr/mr55.html#MichaudPBHGVLG15

Raphael Baillot Yannick Deshayes Yves Ousten Laurent Béchou Photothermal activated failure mechanism in polymer-based packaging of low power InGaN/GaN MQW LED under active storage. 1759-1764 2015 55 Microelectron. Reliab. 9-10 https://doi.org/10.1016/j.microrel.2015.06.145 db/journals/mr/mr55.html#BaillotDOB15

Ephraim Suhir Laurent Béchou Saint-Venant's principle and the minimum length of a dual-coated optical fiber specimen in reliability (proof) testing. 1506-1509 2013 53 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2013.07.112 db/journals/mr/mr53.html#SuhirB13

A. Royon K. Bourhis Laurent Béchou Thierry Cardinal Lionel Canioni Yannick Deshayes Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy. 1514-1518 2013 53 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2013.07.110 db/journals/mr/mr53.html#RoyonBBCCD13

Piero Spezzigu Laurent Béchou Gianandrea Quadri Olivier Gilard Yves Ousten Massimo Vanzi An original DoE-based tool for silicon photodetectors EoL estimation in space environments. 1999-2003 2011 51 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2011.07.036 db/journals/mr/mr51.html#SpezziguBQGOV11

Daniel T. Cassidy Chadwick K. Hall Othman Rehioui Laurent Béchou Strain estimation in III-V materials by analysis of the degree of polarization of luminescence. 462-466 2010 50 Microelectron. Reliab. 4 https://doi.org/10.1016/j.microrel.2009.11.003 db/journals/mr/mr50.html#CassidyHRB10

Raphael Baillot Yannick Deshayes Laurent Béchou T. Buffeteau I. Pianet C. Armand F. Voillot S. Sorieul Yves Ousten Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses. 1568-1573 2010 50 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2010.07.056 db/journals/mr/mr50.html#BaillotDBBPAVSO10

M. L. Bourqui Laurent Béchou Olivier Gilard Yannick Deshayes Pamela Del Vecchio L. S. How F. Rosala Yves Ousten André Touboul Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications. 1202-1207 2008 48 Microelectron. Reliab. 8-9 https://doi.org/10.1016/j.microrel.2008.07.012 db/journals/mr/mr48.html#BourquiBGDVHROT08

Yannick Deshayes Isabelle Bord-Majek G. Barreau M. Aiche Philippe Moretto Laurent Béchou A. C. Roehrig Yves Ousten Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation. 1354-1360 2008 48 Microelectron. Reliab. 8-9 https://doi.org/10.1016/j.microrel.2008.06.044 db/journals/mr/mr48.html#DeshayesBBAMBRO08

Jean Augereau Yves Ousten Bruno Levrier Laurent Béchou Use of signal processing imaging for the study of a 3D package in harsh environment. 1922-1925 2006 46 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2006.07.081 db/journals/mr/mr46.html#AugereauOLB06

S. Huyghe Laurent Béchou Nicolas Zerounian Yannick Deshayes Frédéric Aniel A. Denolle Dominique Laffitte Jean-Luc Goudard Yves Danto Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier. 1593-1599 2005 45 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2005.07.067 db/journals/mr/mr45.html#HuygheBZDADLGD05

Laurent Mendizabal Laurent Béchou Yannick Deshayes Frédéric Verdier Yves Danto Dominique Laffitte Jean-Luc Goudard F. Houé Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests. 1337-1342 2004 44 Microelectron. Reliab. 9-11 https://doi.org/10.1016/j.microrel.2004.07.025 db/journals/mr/mr44.html#MendizabalBDVDLGH04

Yannick Deshayes Laurent Béchou Jean-Yves Delétage Frédéric Verdier Yves Danto Dominique Laffitte Jean-Luc Goudard Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules. 1125-1136 2003 43 Microelectron. Reliab. 7 https://doi.org/10.1016/S0026-2714(03)00099-4 db/journals/mr/mr43.html#DeshayesBDVDLG03

Jean-Yves Delétage F. J.-M. Verdier Bernard Plano Yannick Deshayes Laurent Béchou Yves Danto Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations. 1137-1144 2003 43 Microelectron. Reliab. 7 https://doi.org/10.1016/S0026-2714(03)00101-X db/journals/mr/mr43.html#DeletageVPDBD03

Laurent Mendizabal Jean-Louis Verneuil Laurent Béchou Christelle Aupetit-Berthelemot Yannick Deshayes Frédéric Verdier Jean-Michel Dumas Yves Danto Dominique Laffitte Jean-Luc Goudard Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator. 1743-1749 2003 43 Microelectron. Reliab. 9-11 https://doi.org/10.1016/S0026-2714(03)00290-7 db/journals/mr/mr43.html#MendizabalVBADVDDLG03

Laurent Béchou Dominique Dallet Yves Danto Pasquale Daponte Yves Ousten Sergio Rapuano An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy. 135-142 2003 52 IEEE Trans. Instrum. Meas. 1 https://doi.org/10.1109/TIM.2003.809071 db/journals/tim/tim52.html#BechouDDDOR03

B. Trégon Yves Ousten Yves Danto Laurent Béchou Bernard Parmentier Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions. 1113-1120 2002 42 Microelectron. Reliab. 7 https://doi.org/10.1016/S0026-2714(02)00046-X db/journals/mr/mr42.html#TregonODBP02

Jean Augereau Yves Ousten Laurent Béchou Yves Danto Acoustic analysis of an assembly: Structural identification by signal processing (wavelets). 1517-1522 2002 42 Microelectron. Reliab. 9-11 https://doi.org/10.1016/S0026-2714(02)00182-8 db/journals/mr/mr42.html#AugereauOBD02

M. Aiche Frédéric Aniel C. Armand Jean Augereau Christelle Aupetit-Berthelemot Raphael Baillot M. Balmont G. Barreau M. Bettiati Isabelle Bord-Majek K. Bourhis M. L. Bourqui T. Buffeteau Lionel Canioni Thierry Cardinal Daniel T. Cassidy Arnaud Curutchet Dominique Dallet Yves Danto Pasquale Daponte Jean-Yves Delétage A. Denolle Yannick Deshayes Jean-Michel Dumas G. Le Galès Olivier Gilard Jean-Luc Goudard Stéphane Grauby Chadwick K. Hall F. Houé L. S. How S. Huyghe S. Joly Nathalie Labat Dominique Laffitte F. Laruelle Bruno Levrier Giulia Marcello Laurent Mendizabal Jérémy Michaud Philippe Moretto Giovanna Mura Yves Ousten Bernard Parmentier Guillaume Pedroza I. Pianet Bernard Plano B. Poupard Gianandrea Quadri Sergio Rapuano Othman Rehioui A. C. Roehrig F. Rosala A. Royon S. Sorieul Piero Spezzigu Ephraim Suhir André Touboul B. Trégon Massimo Vanzi Pamela Del Vecchio F. J.-M. Verdier Frédéric Verdier Jean-Louis Verneuil David Veyrié F. Voillot Nicolas Zerounian